| Time：1101006 (Wed.) 14:20~16:20
Here is the link: meet.google.com/zyf-tkps-ure Speaker：Prof. 葉勝玄(YEH, Sheng-Shiuan) 國立陽明交通大學國際半導體產業學院/International College of Semiconductor Technology, National Yang Ming Chiao Tung University Title：Probing thermally activated atomic and nanocrystalline defect motion in thin metallic nanowires Abstract：Dynamical structural defects exist naturally in a wide variety of solids. They fluctuate temporally and hence can deteriorate the performance of many electronic devices. This is an emergent issue considering the current development of nanodevices with ultralow electrical noise, qubits with long quantum coherence time, and nanoelectromechanical system sensors with ultrahigh resolution. In this talk we will report observations of thermally activated atomic defect motion as well as nanocrystalline defect motion through electrical noise processes in thin metallic RuO2 rutile nanowires around room temperature. First, we extract the energy-distribution function and the number density of mobile atomic defects (oxygen vacancies). Second, we obtain the geometrical size, grain-boundary bonding strength, and relaxation times of dynamic nanocrystallites. Our results show clearly a powerful probe for effective and noninvasive characterizations of nanostructures and nanomaterials for which quantitative information about mechanical hardness, breakdown current density, and/or resistance noise is essential [1-3]. References [1] S.-S. Yeh, W.-Y. Chang, and J.-J. Lin, Probing nanocrystalline grain dynamics in nanodevices, Sci. Adv. 3, e1700135 (2017). [2] S.-S. Yeh, K. H. Gao, T.-L. Wu, T.-K. Su, and J.-J. Lin, Activation Energy Distribution of Dynamical Structural Defects in RuO2 Films, Phys. Rev. Appl. 10, 034004 (2018). [3] S.-S. Yeh, C.-Y. Yu, Y.-T. Lee, S.-P. Chiu, and J.-J. Lin, Probing Thermally Activated Atomic and Nanocrystalline Defect Motion Through Noise Processes in RuO2 Nanowires, Phys. Rev. Appl. 14, 024050 (2020). Place：B101, Gongquan Campuses, NTNU |
